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                  Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of methane impurity in H2, O2, N2, Ar and He by using a flame ionization detector (FID).
STANDARD published on 1.3.1991
    
        Designation standards: DIN 50450-3:1991-03
                
                
                
                Note:    WITHDRAWN
               
                Publication date standards:  1.3.1991
                  SKU:  NS-203848
          The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
        Country:          German technical standard
        Category: Technical standards DIN
        
                
              
Prüfung von Materialien für die Halbleitertechnologie; Bestimmung von Verunreinigungen in Träger- und Dotiergasen; Bestimmung von Methanverunreinigungen in Wasserstoff, Sauerstoff, Stickstoff, Argon und Helium mit einem Flammenionisationsdetektor (FID).
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Latest update:  2025-11-03 (Number of items: 2 242 248) 
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