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Standard DIN 50455-1:2009-10 1.10.2009 preview

DIN 50455-1:2009-10

Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods.



STANDARD published on 1.10.2009


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The information about the standard:

Designation standards: DIN 50455-1:2009-10
Publication date standards: 1.10.2009
SKU: NS-203877
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN

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Annotation of standard text DIN 50455-1:2009-10 :

Prüfung von Materialien für die Halbleitertechnologie - Verfahren zur Charakterisierung von Fotolacken - Teil 1: Bestimmung der Schichtdicke mit optischen Messverfahren.

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