Standard DIN 50455-1:2009-10 1.10.2009 preview

DIN 50455-1:2009-10

Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods.



STANDARD published on 1.10.2009


Language
Format
AvailabilityIN STOCK
Price48.90 USD excl. VAT
48.90 USD

The information about the standard:

Designation standards: DIN 50455-1:2009-10
Publication date standards: 1.10.2009
SKU: NS-203877
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Semiconducting materials

Annotation of standard text DIN 50455-1:2009-10 :

Prüfung von Materialien für die Halbleitertechnologie - Verfahren zur Charakterisierung von Fotolacken - Teil 1: Bestimmung der Schichtdicke mit optischen Messverfahren.

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.