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Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods.
STANDARD published on 1.10.2009
Designation standards: DIN 50455-1:2009-10
Publication date standards: 1.10.2009
SKU: NS-203877
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN
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