Standard DIN 50455-2:1999-11 1.11.1999 preview

DIN 50455-2:1999-11

Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists.



STANDARD published on 1.11.1999


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50.40 USD

The information about the standard:

Designation standards: DIN 50455-2:1999-11
Publication date standards: 1.11.1999
SKU: NS-203879
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Semiconducting materials

Annotation of standard text DIN 50455-2:1999-11 :

Prüfung von Materialien für die Halbleitertechnologie - Verfahren zur Charakterisierung von Fotolacken - Teil 2: Bestimmung der Lichtempfindlichkeit von Positiv-Fotolacken.

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