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Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists.
STANDARD published on 1.11.1999
Designation standards: DIN 50455-2:1999-11
Publication date standards: 1.11.1999
SKU: NS-203879
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: German technical standard
Category: Technical standards DIN
Prüfung von Materialien für die Halbleitertechnologie - Verfahren zur Charakterisierung von Fotolacken - Teil 2: Bestimmung der Lichtempfindlichkeit von Positiv-Fotolacken.
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