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WITHDRAWN DIN EN 60749-3:2003-04 1.4.2003 preview

DIN EN 60749-3:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection.



STANDARD published on 1.4.2003


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The information about the standard:

Designation standards: DIN EN 60749-3:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
SKU: NS-237820
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: German technical standard
Category: Technical standards DIN

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Annotation of standard text DIN EN 60749-3:2003-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 3: Äußere Sichtprüfung.

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