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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature.
STANDARD published on 1.4.2003
Designation standards: DIN EN 60749-6:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
SKU: NS-237837
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur.
Latest update: 2024-04-17 (Number of items: 2 859 866)
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