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WITHDRAWN DIN EN 60749-6:2003-04 1.4.2003 preview

DIN EN 60749-6:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature.



STANDARD published on 1.4.2003


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The information about the standard:

Designation standards: DIN EN 60749-6:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
SKU: NS-237837
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN

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Annotation of standard text DIN EN 60749-6:2003-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur.

Latest update: 2024-04-17 (Number of items: 2 859 866)
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