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Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates.
STANDARD published on 1.4.2015
Designation standards: DIN EN 62047-22:2015-04
Publication date standards: 1.4.2015
SKU: NS-583028
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN
Semiconductor devices in generalElectromechanical components in general
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 22: Elektromechanisches Zug-Prüfverfahren für leitfähige Dünnschichten auf flexiblen Substraten.
1.12.2003
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1.4.2003
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Latest update: 2024-04-23 (Number of items: 2 895 375)
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