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Standard DIN EN 62373:2007-01 1.1.2007 preview

DIN EN 62373:2007-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET).



STANDARD published on 1.1.2007


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The information about the standard:

Designation standards: DIN EN 62373:2007-01
Publication date standards: 1.1.2007
SKU: NS-239812
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Transistors

Annotation of standard text DIN EN 62373:2007-01 :

Stabilitätsprüfung unter Temperatur-Spannungs-Beanspruchung für Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET).

Similar standards:

ČSN EN 120003ČSN EN 120003

1.7.1998

ČSN EN 120004ČSN EN 120004

1.12.1997

ČSN EN 62373ČSN EN 62373

1.3.2007

ČSN EN 62417ČSN EN 62417

1.12.2010

ČSN EN 62416ČSN EN 62416

1.12.2010

STN EN 150003STN EN 150003

1.11.2000

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