Standard DIN EN 62373:2007-01 1.1.2007 preview

DIN EN 62373:2007-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET).



STANDARD published on 1.1.2007


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The information about the standard:

Designation standards: DIN EN 62373:2007-01
Publication date standards: 1.1.2007
SKU: NS-239812
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Transistors

Annotation of standard text DIN EN 62373:2007-01 :

Stabilitätsprüfung unter Temperatur-Spannungs-Beanspruchung für Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET).

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