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Standard DIN EN 62418:2010-12 1.12.2010 preview

DIN EN 62418:2010-12

Semiconductor devices - Metallization stress void test.



STANDARD published on 1.12.2010


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The information about the standard:

Designation standards: DIN EN 62418:2010-12
Publication date standards: 1.12.2010
SKU: NS-239836
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Metallic coatingsSemiconductor devices in general

Annotation of standard text DIN EN 62418:2010-12 :

Halbleiterbauelemente - Prüfverfahren zur Metallisierungs-Stressmigration.

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WITHDRAWN
1.11.2003

Latest update: 2025-06-15 (Number of items: 2 204 137)
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