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WITHDRAWN E DIN EN 60749-44:2014-08 1.8.2014 preview

E DIN EN 60749-44:2014-08 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.



STANDARD published on 1.8.2014


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The information about the standard:

Designation standards: E DIN EN 60749-44:2014-08
Note: WITHDRAWN
Publication date standards: 1.8.2014
SKU: NS-291925
The number of pages: 33
Approximate weight : 99 g (0.22 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN EN 60749-44:2014-08 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen.

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