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                  Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson´s ratio of thin film MEMS materials.
STANDARD published on 1.11.2012
    
        Designation standards: E DIN EN 62047-21:2012-11
                
                
                
                Note:    WITHDRAWN
               
                Publication date standards:  1.11.2012
                  SKU:  NS-292596
          The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
        Country:          German technical standard (Draft)
        Category: Technical standards DIN
        
                
              
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 21: Prüfverfahren zur Querkontraktionszahl von Dünnschichtwerkstoffen der Mikrosytsemtechnik.
Latest update:  2025-11-03 (Number of items: 2 242 248) 
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