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IEC 60749-1-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
STANDARD published on 30.8.2002
The information about the standard:
Designation standards: IEC 60749-1-ed.1.0
Publication date standards: 30.8.2002
SKU: NS-411361
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-1-ed.1.0 :
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres)et etablit des dispositions communes a toutes les autres parties de la serie. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.
These corrections apply to this standard:
IEC 60749-1-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)
Correction published on 12.8.2003
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