IEC 60749-1-ed.1.0/Cor.1

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General

STANDARD published on 12.8.2003

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The information about the standard:

Designation standards: IEC 60749-1-ed.1.0/Cor.1
Note: Correction
Publication date standards: 12.8.2003
SKU: NS-411360
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Semiconductor devices in general

Annotation of standard text IEC 60749-1-ed.1.0/Cor.1 :

Modification of the validity date: now put at 2007. Modification de la date de validite : fixee maintenant a 2007.

This change (correction) applies to this standard:

IEC 60749-1-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Standard published on 30.8.2002

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