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IEC 60749-11-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
STANDARD published on 12.4.2002
The information about the standard:
Designation standards: IEC 60749-11-ed.1.0
Publication date standards: 12.4.2002
SKU: NS-411366
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-11-ed.1.0 :
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy. Definit la methode dessai de variations rapides de temperature et la methode des deux bains. Cette derniere methode dessai peut egale-ment etre utilisee, en appliquant moins de cycles, pour determiner leffet de limmersion dans des liquides chauds qui est utilisee pour le nettoyage des dispositifs. Cet essai est applicable a tous les dispositifs a semiconducteurs. Il est considere comme destructif, sauf stipulation contraire dans la specification applicable. Le contenu des corrigenda de janvier 2003 et daout 2003 a ete pris en consideration dans cet exemplaire.
These corrections apply to this standard:
IEC 60749-11-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
Correction published on 30.1.2003
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IEC 60749-11-ed.1.0/Cor.2
Correction
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Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 2 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
Correction published on 13.8.2003
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