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IEC 60749-11-ed.1.0/Cor.1
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
STANDARD published on 30.1.2003
The information about the standard:
Designation standards: IEC 60749-11-ed.1.0/Cor.1
Note: Correction
Publication date standards: 30.1.2003
SKU: NS-411364
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
This change (correction) applies to this standard:
IEC 60749-11-ed.1.0
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
Standard published on 12.4.2002
Selected format:Show all technical information.
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