We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
STANDARD published on 17.1.2003
Designation standards: IEC 60749-16-ed.1.0
Publication date standards: 17.1.2003
SKU: NS-411373
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: International technical standard
Category: Technical standards IEC
Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills). Definit un essai permettant de detecter la presence de particules libres a linterieur dun dispositif a cavite, comme des particules de ceramique, des elements de fil de liaison ou des boules de brasure (granules).
25.2.2010
11.12.2001
30.8.2010
30.8.2010
11.12.2012
29.9.2000
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2026-01-26 (Number of items: 2 257 479)
© Copyright 2026 NORMSERVIS s.r.o.