Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEC 60749-2-ed.1.0/Cor.1
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
STANDARD published on 12.8.2003
The information about the standard:
Designation standards: IEC 60749-2-ed.1.0/Cor.1
Note: Correction
Publication date standards: 12.8.2003
SKU: NS-411379
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-2-ed.1.0/Cor.1 :
Modification of the validity date: now put at 2007. Modification de la date de validite : fixee maintenant a 2007.
This change (correction) applies to this standard:
IEC 60749-2-ed.1.0
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 2: Basse pression atmospherique)
Standard published on 12.4.2002
Selected format:Show all technical information.
We recommend:
Updating of laws
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
