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IEC 60749-27-ed.2.0/Amd.1
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
STANDARD published on 25.9.2012
The information about the standard:
Designation standards: IEC 60749-27-ed.2.0/Amd.1
Note: Change
Publication date standards: 25.9.2012
SKU: NS-620068
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
This change (correction) applies to this standard:
IEC 60749-27-ed.2.0
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Standard published on 18.7.2006
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