Standard IEC 60749-27-ed.2.0 18.7.2006 preview

IEC 60749-27-ed.2.0

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)



STANDARD published on 18.7.2006


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The information about the standard:

Designation standards: IEC 60749-27-ed.2.0
Publication date standards: 18.7.2006
SKU: NS-411392
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Semiconductor devices in general

Annotation of standard text IEC 60749-27-ed.2.0 :

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive Etablit une procedure normalisee pour les essais et les classements des dispositifs a semiconducteurs en fonction de leur sensibilite aux dommages ou a la degradation du fait de leur exposition a une decharge electrostatique (DES) sur un modele de machine (MM) defini. Elle peut etre utilisee comme une methode dessai en variante a la methode dessai de DES sur le modele du corps humain. Lobjectif est de fournir des resultats dessai de DES fiables et reproductibles de maniere a ce que des classifications precises puissent etre realisees. Cette methode dessai est applicable a tous les dispositifs a semiconducteurs et elle est classee destructive.

These changes apply to this standard:

IEC 60749-27-ed.2.0/Amd.1 Change

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Amendement 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))

Change published on 25.9.2012

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