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IEC 60749-31-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
STANDARD published on 30.8.2002
The information about the standard:
Designation standards: IEC 60749-31-ed.1.0
Publication date standards: 30.8.2002
SKU: NS-411402
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-31-ed.1.0 :
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres), cet essai determine si le dispositif prend feu par suite dun echauffement interne du a des surcharges excessives. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.
These corrections apply to this standard:
IEC 60749-31-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 31: Inflammabilite des dispositifs a encapsulation plastique (cas d´une cause interne d´inflammation))
Correction published on 13.8.2003
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