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IEC 60749-31-ed.1.0/Cor.1
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
STANDARD published on 13.8.2003
The information about the standard:
Designation standards: IEC 60749-31-ed.1.0/Cor.1
Note: Correction
Publication date standards: 13.8.2003
SKU: NS-411401
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-31-ed.1.0/Cor.1 :
Modification of the validity date: now put at 2007. Modification de la date de validite : fixee maintenant a 2007.
This change (correction) applies to this standard:
IEC 60749-31-ed.1.0
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 31: Inflammabilite des dispositifs a encapsulation plastique (cas d´une cause interne d´inflammation))
Standard published on 30.8.2002
Selected format:Show all technical information.
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