IEC 62047-10-ed.1.0/Cor.1

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

STANDARD published on 28.2.2012

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The information about the standard:

Designation standards: IEC 62047-10-ed.1.0/Cor.1
Note: Correction
Publication date standards: 28.2.2012
SKU: NS-414097
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Other semiconductor devices

This change (correction) applies to this standard:

IEC 62047-10-ed.1.0

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
(Dispositifs a semiconducteur - Dispositifs microelectromecaniques - Partie 10: Essai de compression utilisant la technique des micro-piliers pour les materiaux des MEMS)

Standard published on 26.7.2011

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