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Change STN EN 60749-19:2003/A1 1.12.2010 preview

STN EN 60749-19:2003/A1 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength



STANDARD published on 1.12.2010


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The information about the standard:

Designation standards: STN EN 60749-19:2003/A1
Classification mark: 358799
Catalog number: 112186
Note: Change
Publication date standards: 1.12.2010
SKU: NS-528299
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-19:2003/A1 (01.05.2011)

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Preview STN EN 60749-19 1.11.2003
STN EN 60749-19 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

Standard published on 1.11.2003

We recommend simillar standard:!
ČSN EN 60749-19 (01.12.2003)
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