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Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 29: Skúška latch-up (Norma na priame používanie ako STN).
Automatically translated name:
Semiconductor devices. Mechanical and climatic test methods. Part 29: Test latch-up (IEC STN).
STANDARD published on 1.12.2011
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Designation standards: STN EN 60749-29
Classification mark: 358799
Catalog number: 114454
Publication date standards: 1.12.2011
SKU: NS-528318
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN
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Latest update: 2025-11-04 (Number of items: 2 242 248)
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