Standard STN EN 60749-38 1.1.2009 preview

STN EN 60749-38 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory



STANDARD published on 1.1.2009


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The information about the standard:

Designation standards: STN EN 60749-38
Classification mark: 358799
Catalog number: 107323
Publication date standards: 1.1.2009
SKU: NS-528332
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-38 (01.10.2008)

The category - similar standards:

Semiconductor devices in general

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