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        Polovodičové súčiastky. Elektromechanické mikrosúčiastky. Časť 12: Skúšobné metódy tenkovrstvových materiálov na namáhanie ohýbaním s využitím rezonančnej vibrácie štruktúr MEMS (Norma na priame používanie ako STN).
          Automatically translated name:
          Semiconductor devices.  Electromechanical micro devices.  Part 12: Test methods of thin film materials for bending stress using resonant vibration of MEMS structures (IEC STN).        
      
STANDARD published on 1.3.2012
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        Designation standards: STN EN 62047-12
                Classification mark:  358792
                
                Catalog number:  114772
                
                
               
                Publication date standards:  1.3.2012
                  SKU:  NS-531592
          Approximate weight : 36 g (0.08 lbs)
        Country:          Slovak technical standard
        Category: Technical standards STN
        
                
        
          
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