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Standard STN EN 62047-8 1.8.2011 preview

STN EN 62047-8 (358792)

Semiconductor devices - Micro-electromechanical devices -- Part 8: Strip bending test method for tensile property measurement of thin films



STANDARD published on 1.8.2011


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The information about the standard:

Designation standards: STN EN 62047-8
Classification mark: 358792
Catalog number: 113687
Publication date standards: 1.8.2011
SKU: NS-531606
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 62047-8 (01.12.2011)

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The category - similar standards:

Other semiconductor devices

Similar standards:

STN EN 62047-6STN EN 62047-6

1.6.2010

STN EN 62047-7STN EN 62047-7

1.11.2011

STN EN 62047-9STN EN 62047-9

1.12.2011

STN EN 62047-10STN EN 62047-10

1.12.2011

STN EN 62047-11STN EN 62047-11

1.2.2014

STN EN 62047-12STN EN 62047-12

1.3.2012

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