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UNE-EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Automatically translated name:
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 23: HIGH TEMPERATURE OPERATING LIFE
STANDARD published on 21.12.2011
The information about the standard:
Designation standards: UNE-EN 60749-23:2005/A1:2011
Note: Change
Publication date standards: 21.12.2011
SKU: NS-560999
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Spanish technical standard
Category: Technical standards UNE
The category - similar standards:
This change (correction) applies to this standard:
UNE-EN 60749-23:2005
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Standard published on 16.3.2005
Selected format:Show all technical information.
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