UNE-EN 60749-23:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

Automatically translated name:

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS -- PART 23: HIGH TEMPERATURE OPERATING LIFE

STANDARD published on 16.3.2005

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Format	electronic design (pdf) - 58.10 USD Print design - 63.90 USD
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The information about the standard:

Designation standards: UNE-EN 60749-23:2005
Publication date standards: 16.3.2005
SKU: NS-561000
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: Spanish technical standard
Category: Technical standards UNE

The category - similar standards:

Semiconductor devices in general

These changes apply to this standard:

UNE-EN 60749-23:2005/A1:2011 Change

Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

Change published on 21.12.2011

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UNE-EN 60749-30:2005..

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2.11.2005

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