IEC - International electro-technical commission - Page 133

Standards IEC - International electro-technical commission - Page 133

IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.

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IEC 60191-6-2-ed.1.0/Cor.1 Correction

Corrigendum 1 - Mechanical standardization of semiconductor devices - Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages

Correction published on 18.10.2002

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IEC 60191-6-20-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-20: Regles generales pour la preparation des dessins d´encombrement des boitiers pour dispositifs a semiconducteurs pour montage en surface - Methodes de mesure pour les dimensions des boitiers a sortie en J (SOJ) de faible encombrement)

Standard published on 30.8.2010

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IEC 60191-6-21-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)
(Normalisation mecanique des dispositifs a semiconducters - Partie 6-21: Regles generales pour la preparation des dessins d´encombrement des boitiers pour dispositifs a semiconducteurs pour montage en surface - Methodes de mesure pour les dimensions des boitiers de faible encombrement (SOP))

Standard published on 30.8.2010

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IEC 60191-6-22-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fine-pitch Land Grid Array (S-FBGA and S-FLGA)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-22: Regles generales pour la preparation des dessins d´encombrement des dispositifs a semiconducteurs a montage en surface - Guide de conception pour les boitiers matriciels a billes et a pas fins en silicium et boitiers matriciels a zone de contact plate et a pas fins en silicium (S-FBGA et S-FLGA))

Standard published on 11.12.2012

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172.30 USD


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IEC 60191-6-3-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-3: Regles generales pour la preparation des dessins d´encombrement des dispositifs a semiconducteurs a montage en surface - Methodes de mesure pour les boitiers plats quadrangulaires (QFP))

Standard published on 29.9.2000

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IEC 60191-6-4-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-4: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of ball grid array (BGA)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-4: Regles generales pour la preparation des dessins d´encombrement des dispositifs a semiconducteurs a montage en surface - Methodes de mesure pour les dimensions des boitiers matriciels a billes (BGA))

Standard published on 11.6.2003

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IEC 60191-6-5-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-5: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch ball grid array (FBGA)

Standard published on 27.8.2001

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IEC 60191-6-6-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine pitch land grid array (FLGA)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-6: Regles generales pour la preparation des dessins d´encombrement des dispositifs a semiconducteurs a montage en surface - Guide de conception des dispositifs FLGA)

Standard published on 22.3.2001

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IEC 60191-6-8-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-8: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for glass sealed ceramic quad flatpack (G-QFP)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-8: Regles generales pour la preparation des dessins d´encombrement des dispositifs a semiconducteurs a montage en surface - Guide de conception pour les boitiers plats quadrangulaires en ceramique, scellement verre (G-QFP))

Standard published on 27.8.2001

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IEC 60191-6-ed.3.0

Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
(Normalisation mecanique des dispositifs a semi-conducteurs - Partie 6: Regles generales pour la preparation des dessins d´encombrement des boitiers pour dispositifs a semi-conducteurs pour montage en surface)

Standard published on 26.11.2009

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374.60 USD


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