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Standards IEC - International electro-technical commission - Page 803
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 62047-47-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures
Standard published on 23.8.2024
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IEC 62047-48-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
Standard published on 7.6.2024
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IEC 62047-49-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers
Standard published on 25.11.2025
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IEC 62047-5-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 5: Commutateurs MEMS-RF)
Standard published on 13.7.2011
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IEC 62047-5-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
(Corrigendum 1 - Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 5: Commutateurs MEMS-RF)
Correction published on 8.3.2012
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IEC 62047-50-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
Standard published on 29.4.2025
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IEC 62047-52-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 52: Biaxial tensile testing method for stretchable MEMS
Standard published on 4.3.2026
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IEC 62047-53-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device
Standard published on 2.10.2025
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IEC 62047-6-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 6: Methodes d´essais de fatigue axiale des materiaux en couche mince)
Standard published on 7.4.2009
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IEC 62047-7-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 7: Filtre et duplexeur BAW MEMS pour la commande et le choix des frequences radioelectriques)
Standard published on 16.6.2011
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