JIS - Japanese technical standards - Page 339

Standards JIS - Japanese technical standards - Page 339

JIS covers industrial and mineral products, comparable to standards established by various industrial associations for specific needs, or standards established and used by companies (operation manuals, products specifications etc.). The need for common practices in companies of the same industrial sector leads to the establishment of industrial association standards, and the same need in terms of wider applications promotes the establishment of JIS.

Price display: excl. VAT
Displayed currency: USD
Sort by:

Narrow the selection for the "JIS - Japanese technical standards - Page 339" by:    


JIS C5583:1992

Helical-scan video tape cassette system using 8 mm magnetic tape -- 8 mm Video

Standard published on 31.8.1992

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5600:2006

Glossary of basic terms used in electrotechnology

Standard published on 20.11.2006

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5601:1975

Glossary of terms used in electronics and telecommunications (radiotelecommunications No.1)

Standard published on 30.6.1975

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5602:1986

Glossary of passive components for electronic equipment

Standard published on 31.3.1986

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5603:1993

Terms and definitions for printed circuits

Standard published on 31.7.1993

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5630-1:2017

Semiconductor devices -- Micro-electromechanical devices -- Part 1: Terms and definitions

Standard published on 21.3.2017

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5630-12:2014

Semiconductor devices -- Micro-electromechanical devices -- Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Standard published on 20.2.2014

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5630-13:2014

Semiconductor devices -- Micro-electromechanical devices -- Part 13: Bend-and shear-type test methods of measuring adhesive strength for MEMS structures

Standard published on 20.2.2014

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5630-18:2014

Semiconductor devices -- Micro-electromechanical devices -- Part 18: Bend testing methods of thin film materials

Standard published on 22.12.2014

Selected format:

Show all technical information.
ON REQUEST


IN STOCK
JIS C5630-19:2014

Semiconductor devices -- Micro-electromechanical devices -- Part 19: Electronic compasses

Standard published on 22.12.2014

Selected format:

Show all technical information.
ON REQUEST


IN STOCK

Entries shown from 3380 to 3390 out of a total of 11847 entries.


Can we help you with something?


Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.