We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
STANDARD published on 1.11.2010
Designation standards: ČSN EN 62047-6
Classification mark: 358775
Catalog number: 86158
Publication date standards: 1.11.2010
SKU: NS-161589
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
Semiconductor devices in generalElectromechanical components in general
1.11.2003
WITHDRAWN
1.12.2003
WITHDRAWN
1.8.2003
1.12.2003
WITHDRAWN
1.5.2010
1.12.2009
Latest update: 2025-11-11 (Number of items: 2 243 547)
© Copyright 2025 NORMSERVIS s.r.o.