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Standard ČSN EN 62374-1 1.7.2011 preview

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ČSN EN 62374-1 (358768)

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers



STANDARD published on 1.7.2011


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The information about the standard:

Designation standards: ČSN EN 62374-1
Classification mark: 358768
Catalog number: 88688
Publication date standards: 1.7.2011
SKU: NS-162086
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

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Semiconductor devices in general

Annotation of standard text ČSN EN 62374-1 (358768):

Tato norma popisuje zkušební metodu, zkušební strukturu a metodu pro odhad životnosti pro zkoušku časově závislého dielektrického průrazu (TDDB) pro intermetalické vrstvy vytvořené pro polovodičové součástky

Preview of the standard ČSN EN 62374-1 (358768)

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Latest update: 2026-01-14 (Number of items: 2 254 595)
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