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Standard DIN EN 60749-25:2004-04 1.4.2004 preview

DIN EN 60749-25:2004-04

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling.



STANDARD published on 1.4.2004


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The information about the standard:

Designation standards: DIN EN 60749-25:2004-04
Publication date standards: 1.4.2004
SKU: NS-237814
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 60749-25:2004-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 25: Zyklische Temperaturwechsel.

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