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Standard DIN EN 62047-3:2007-02 1.2.2007 preview

DIN EN 62047-3:2007-02

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing.



STANDARD published on 1.2.2007


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65.70 USD

The information about the standard:

Designation standards: DIN EN 62047-3:2007-02
Publication date standards: 1.2.2007
SKU: NS-239569
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in generalElectromechanical components in general

Annotation of standard text DIN EN 62047-3:2007-02 :

Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Teil 3: Dünnschicht-Standardmikroprobe für die Prüfung der Zugbeanspruchung.

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WITHDRAWN
1.7.2012

Latest update: 2026-01-06 (Number of items: 2 253 604)
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