Standard DIN EN 62415:2010-12 1.12.2010 preview

DIN EN 62415:2010-12

Semiconductor devices - Constant current electromigration test.



STANDARD published on 1.12.2010


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The information about the standard:

Designation standards: DIN EN 62415:2010-12
Publication date standards: 1.12.2010
SKU: NS-239833
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 62415:2010-12 :

Halbleiterbauelemente - Konstantstrom-Prüfverfahren zur Elektromigration.

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