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IEC 60749-33-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
STANDARD published on 9.3.2004
The information about the standard:
Designation standards: IEC 60749-33-ed.1.0
Publication date standards: 9.3.2004
SKU: NS-411407
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-33-ed.1.0 :
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it. Lessai dautoclave non polarise est realise pour evaluer lintegrite de resistance a lhumidite des dispositifs a letat solide sous boitiers non hermetiques utilisant des environnements a vapeur saturee dhumidite ou a condensation dhumidite. Il sagit dun essai a haute acceleration qui utilise des conditions de pression, dhumidite et temperature dans des conditions de condensation pour accelerer la penetration dhumidite a travers le materiau de protection exterieur ou par linterface entre le materiau de protection exterieur et les conducteurs metalliques qui le traversent.
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