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Standard IEC 62373-ed.1.0 18.7.2006 preview

IEC 62373-ed.1.0

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)



STANDARD published on 18.7.2006


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120.40 USD

The information about the standard:

Designation standards: IEC 62373-ed.1.0
Publication date standards: 18.7.2006
SKU: NS-414553
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: International technical standard
Category: Technical standards IEC

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The category - similar standards:

Transistors

Annotation of standard text IEC 62373-ed.1.0 :

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET) Fournit une procedure dessai pour la stabilite de temperature en polarisation (essai BT) des MOSFET (transistor a effet de champ metaloxyde-semiconducteurs)

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29.3.2007

IEC 62415-ed.1.0IEC 62415-ed.1.0..

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IEC 62416-ed.1.0IEC 62416-ed.1.0..

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IEC 62417-ed.1.0IEC 62417-ed.1.0..

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Latest update: 2025-09-14 (Number of items: 2 232 183)
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