Standard IEC 62415-ed.1.0 19.5.2010 preview

IEC 62415-ed.1.0

Semiconductor devices - Constant current electromigration test



STANDARD published on 19.5.2010


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The information about the standard:

Designation standards: IEC 62415-ed.1.0
Publication date standards: 19.5.2010
SKU: NS-414598
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Semiconductor devices in general

Annotation of standard text IEC 62415-ed.1.0 :

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts. La CEI 62415:2010 decrit une methode pour des essais conventionnels delectromigration en courant constant de lignes metalliques, de chaines de trous de liaison et de contacts de trous de liaison.

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