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IEC 62415-ed.1.0
Semiconductor devices - Constant current electromigration test
STANDARD published on 19.5.2010
The information about the standard:
Designation standards: IEC 62415-ed.1.0
Publication date standards: 19.5.2010
SKU: NS-414598
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62415-ed.1.0 :
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts. La CEI 62415:2010 decrit une methode pour des essais conventionnels delectromigration en courant constant de lignes metalliques, de chaines de trous de liaison et de contacts de trous de liaison.
Similar standards:
15.2.1990
17.12.1991
30.12.1988
15.5.1988
18.7.2006
29.9.2010
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