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STN EN 62374-1 (358794)
Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).
Automatically translated name:
Semiconductor devices. Part 1: Test of time-dependent dielectric breakdown (TDDB) intermetallic layers (IEC STN).
STANDARD published on 1.4.2011
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The information about the standard:
Designation standards: STN EN 62374-1
Classification mark: 358794
Catalog number: 112863
Publication date standards: 1.4.2011
SKU: NS-532088
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN
We recommend simillar standard:!
ČSN EN 62374-1 (01.07.2011)The category - similar standards:
These corrections apply to this standard:
STN EN 62374-1:2011/OpravaAC (358794)
Correction
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Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).
Correction published on 1.6.2011
Selected format: English - Print design (ON REQUEST)
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