Correction STN EN 62374-1:2011/OpravaAC 1.6.2011 preview

STN EN 62374-1:2011/OpravaAC (358794)

Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).

Automatically translated name:

Semiconductor devices. Part 1: Test of time-dependent dielectric breakdown ( TDDB ) intermetallic layers (IEC STN ).



STANDARD published on 1.6.2011


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The information about the standard:

Designation standards: STN EN 62374-1:2011/OpravaAC
Classification mark: 358794
Catalog number: 113426
Note: Correction
Publication date standards: 1.6.2011
SKU: NS-532087
Approximate weight : 12 g (0.03 lbs)
Country: Slovak technical standard
Category: Technical standards STN

This change (correction) applies to this standard:

STN EN 62374-1 (358794)

Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).

Standard published on 1.4.2011

We recommend simillar standard:!
ČSN EN 62374-1 (01.07.2011)
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