Standard DIN EN 60749-33:2004-09 1.9.2004 preview

DIN EN 60749-33:2004-09

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave.



STANDARD published on 1.9.2004


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The information about the standard:

Designation standards: DIN EN 60749-33:2004-09
Publication date standards: 1.9.2004
SKU: NS-237826
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 60749-33:2004-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: Beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung.



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