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Standard DIN EN 60749-29:2012-01 1.1.2012 preview

DIN EN 60749-29:2012-01

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.



STANDARD published on 1.1.2012


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The information about the standard:

Designation standards: DIN EN 60749-29:2012-01
Publication date standards: 1.1.2012
SKU: NS-237818
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 60749-29:2012-01 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.

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