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Standard DIN EN 62047-8:2011-12 1.12.2011 preview

DIN EN 62047-8:2011-12

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films.



STANDARD published on 1.12.2011


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The information about the standard:

Designation standards: DIN EN 62047-8:2011-12
Publication date standards: 1.12.2011
SKU: NS-239574
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in generalElectromechanical components in general

Annotation of standard text DIN EN 62047-8:2011-12 :

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 8: Streifen-Biege-Prüfverfahren zur Messung von Zugbeanspruchungsmerkmalen dünner Schichten.

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Latest update: 2025-12-20 (Number of items: 2 252 706)
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