Standard DIN EN 62047-8:2011-12 1.12.2011 preview

DIN EN 62047-8:2011-12

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films.

STANDARD published on 1.12.2011

AvailabilityIN STOCK
Price98.70 USD excl. VAT
98.70 USD

The information about the standard:

Designation standards: DIN EN 62047-8:2011-12
Publication date standards: 1.12.2011
SKU: NS-239574
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 62047-8:2011-12 :

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 8: Streifen-Biege-Prüfverfahren zur Messung von Zugbeanspruchungsmerkmalen dünner Schichten.

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.

This website uses cookie files. By browsing this website you expresses your consent with using cookies. More information / I understand