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Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films.
STANDARD published on 1.2.2008
Designation standards: DIN EN 62374:2008-02
Publication date standards: 1.2.2008
SKU: NS-239814
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Prüfung des zeitabhängigen dielektrischen Durchbruchs (TDDB) für dielektrische Gate-Schichten.
1.4.2003
WITHDRAWN
1.4.2010
1.10.2009
1.1.2012
1.12.2003
1.7.2011
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