Standard DIN EN 62374:2008-02 1.2.2008 preview

DIN EN 62374:2008-02

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films.



STANDARD published on 1.2.2008


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The information about the standard:

Designation standards: DIN EN 62374:2008-02
Publication date standards: 1.2.2008
SKU: NS-239814
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 62374:2008-02 :

Halbleiterbauelemente - Prüfung des zeitabhängigen dielektrischen Durchbruchs (TDDB) für dielektrische Gate-Schichten.

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