Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEC 60747-1-ed.2.0
Semiconductor devices - Part 1: General
STANDARD published on 21.2.2006
The information about the standard:
Designation standards: IEC 60747-1-ed.2.0
Publication date standards: 21.2.2006
SKU: NS-411269
The number of pages: 89
Approximate weight : 298 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60747-1-ed.2.0 :
IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below: a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted. b) There has been a general revision of guidance on essential ratings and characteristics. c) The distinction between general and reference methods of measurement has been removed. d) A clause on product discontinuation notice has been added. La CEI 60747-1:2006 specifie les exigences generales applicables aux dispositifs discrets a semiconducteurs et aux circuits integres couverts par les autres parties de la CEI 60747 et de la CEI 60748 (voir Annexe A). Cette deuxieme edition de la CEI 60747-1 annule et remplace la premiere edition (1983) et ses amendements 1 (1991), 2 (1993) et 3 (1996). Les principaux changements par rapport a ledition precedente sont enumeres ci-dessous: a) La terminologie figurant actuellement dans le VEI (ou qui etait en contradiction avec le VEI) a ete omise. b) Les lignes directrices relatives aux valeurs limites et caracteristiques essentielles ont fait lobjet dune revision generale. c) La distinction entre methodes de mesure generales et de reference a ete supprimee. d) Un article relatif a lannonce de suppression dun produit a ete ajoute.
These changes apply to this standard:
IEC 60747-1-ed.2.0/Amd.1
Change
Show all technical information.
Amendment 1 - Semiconductor devices - Part 1: General
(Amendement 1 - Dispositifs a semiconducteurs - Partie 1: Generalites)
Change published on 19.5.2010
Selected format:Show all technical information.
These corrections apply to this standard:
IEC 60747-1-ed.2.0/Cor.1
Correction
Show all technical information.
Corrigendum 1 - Semiconductor devices - Part 1: General
Correction published on 8.9.2008
Selected format:Show all technical information.
Similar standards:
30.12.1988
15.5.1988
18.7.2006
29.9.2010
29.3.2007
19.5.2010
We recommend:
Updating of laws
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
