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Preview ASTM F126 1.1.1900
ASTM F126 Historical

Definitions of Terms Relating to Which Relate to the Use and Testing of Ferrite Memory Cores and Memory Core Arrays (Withdrawn 1976)

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Preview ASTM F1260-89 1.1.1989 Preview of the standard
ASTM F1260-89 Historical

Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations

WITHDRAWN published on 1.1.1989

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Preview ASTM F1260M-96 1.1.1996 Preview of the standard
ASTM F1260M-96 Historical

Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]

WITHDRAWN published on 1.1.1996

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Preview ASTM F1260M-96(2003) 10.6.1996 Preview of the standard
ASTM F1260M-96(2003) Historical

Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)

WITHDRAWN published on 10.6.1996

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Preview ASTM F1261M-96 1.1.1996 Preview of the standard
ASTM F1261M-96 Historical

Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]

WITHDRAWN published on 1.1.1996

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Preview ASTM F1261M-96(2003) 10.6.1996 Preview of the standard
ASTM F1261M-96(2003) Historical

Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)

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Preview ASTM F1262M-14 1.6.2014 Preview of the standard
ASTM F1262M-14 Historical

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

WITHDRAWN published on 1.6.2014

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Preview ASTM F1262M-95 10.11.1995 Preview of the standard
ASTM F1262M-95 Historical

Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

WITHDRAWN published on 10.11.1995

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Preview ASTM F1262M-95(2002) 10.12.2002 Preview of the standard
ASTM F1262M-95(2002) Historical

Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

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Preview ASTM F1262M-95(2008) 15.6.2008 Preview of the standard
ASTM F1262M-95(2008) Historical

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

WITHDRAWN published on 15.6.2008

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Entries shown from 80410 to 80420 out of a total of 92190 entries.

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