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Standards IEC - International electro-technical commission - Page 384
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 60747-16-6-ed.1.0
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Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
(Dispositifs a semiconducteurs - Partie 16-6: Circuits integres hyperfrequences – Multiplicateurs de frequence)
Standard published on 26.6.2019
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IEC 60747-16-7-ed.1.0
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Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
(Dispositifs a semiconducteurs - Partie 16-7: Circuits integres hyperfrequences - Attenuateurs)
Standard published on 29.11.2022
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IEC 60747-16-8-ed.1.0
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Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
(Dispositifs a semiconducteurs - Partie 16-8: Circuits integres hyperfrequences - Limiteurs)
Standard published on 29.11.2022
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IEC 60747-16-9-ed.1.0
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Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
(Dispositifs a semiconducteurs - Partie 16-9: Circuits integres hyperfrequences - Dephaseurs)
Standard published on 9.10.2024
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IEC 60747-17-ed.1.0
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Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
(Dispositifs a semiconducteurs - Partie 17 : Coupleur magnetique et capacitif pour l’isolation principale et renforcee)
Standard published on 21.9.2020
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IEC 60747-17-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
(Corrigendum 1 - Dispositifs a semiconducteurs - Partie 17: Coupleur magnetique et capacitif pour l’isolation principale et renforcee)
Correction published on 19.1.2021
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IEC 60747-18-1-ed.1.0
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Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Standard published on 20.5.2019
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IEC 60747-18-2-ed.1.0
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Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
Standard published on 7.2.2020
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IEC 60747-18-3-ed.1.0
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Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Standard published on 11.12.2019
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IEC 60747-18-4-ed.1.0
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Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Standard published on 16.3.2023
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