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Standard DIN EN 60749-40:2012-02 1.2.2012 preview

DIN EN 60749-40:2012-02

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge.



STANDARD published on 1.2.2012


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The information about the standard:

Designation standards: DIN EN 60749-40:2012-02
Publication date standards: 1.2.2012
SKU: NS-237835
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 60749-40:2012-02 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 40: Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen.

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