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Standard DIN EN 62374-1:2011-06 1.6.2011 preview

DIN EN 62374-1:2011-06

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers.



STANDARD published on 1.6.2011


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The information about the standard:

Designation standards: DIN EN 62374-1:2011-06
Publication date standards: 1.6.2011
SKU: NS-239813
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 62374-1:2011-06 :

Halbleiterbauelemente - Teil 1: Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen.

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Latest update: 2024-04-26 (Number of items: 2 896 057)
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